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Structural characterization of SiC nanoparticles

Baoxing Sun Ruobing Xie Cun Yu Cheng Li Hongjie Xu

半导体学报（英文版）2017，Vol.38Issue(10)：46-49,4.

半导体学报（英文版）2017，Vol.38Issue(10)：46-49,4.DOI:10.1088/1674-4926/38/10/103002

Structural characterization of SiC nanoparticles

Baoxing Sun ¹Ruobing Xie ²Cun Yu ¹Cheng Li ¹Hongjie Xu¹

作者信息

1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
2. University of Chinese Academy of Sciences, Beijing 100049, China
折叠

摘要

关键词

SiC nanoparticles/small angle X-ray scattering/XRD/TEM/SAXS

Key words

SiC nanoparticles/small angle X-ray scattering/XRD/TEM/SAXS

引用本文复制引用

Baoxing Sun,Ruobing Xie,Cun Yu,Cheng Li,Hongjie Xu..Structural characterization of SiC nanoparticles[J].半导体学报（英文版）,2017,38(10):46-49,4.

基金项目

Project supported by the National Natural Science Foundation of China (No.11505273) and the Strategic Priority Research Program of the Chinese Academy of Sciences (No.XDA02000000). （No.11505273）

半导体学报（英文版）

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ISSN：1674-4926

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