中国电机工程学报2017，Vol.37Issue(18)：5427-5436,10.DOI:10.13334/j.0258-8013.pcsee.161575
考虑老化进程对热参数影响的IGBT模块寿命评估
Lifetime Estimation of IGBT Module Considering Influence of Aging Process on Thermal Parameters
摘要
Abstract
The insulated gate bipolar transistor (IGBT) is one of the weakest components in a wind converter,of which accurate life prediction and reliability assessment are essential to the safety and reliability of wind energy conversion system.However,the thermal resistance is assumed to be kept constant during the whole operation process in commonly used lifetime estimation model,which would overrate IGBT modules' lifetime.In this paper,a lifetime estimation model,in which the thermal parameters change and temperature rising caused by thermal resistance increase were taken into account,was proposed.Firstly,theoretical and experimental analyses were done to discuss the effect of thermal resistance increase,and an equal percentage update feedback loop method was adopted to present this effect.Then,comparisons between some existing models and the proposed model were made.Finally,an actual wind energy conversion system is chosen as a case study,the multi-scale lifetime consumption of IGBT module was investigated,in which the influence of aging thermal resistance was considered.关键词
绝缘栅双极型晶体管/热阻/老化进程影响/寿命消耗/多时间尺度Key words
insulated gate bipolar transistor (IGBT)/thermal resistance/influence of aging/lifetime consumption/multi-scale time分类
信息技术与安全科学引用本文复制引用
陈民铀,陈一高,高兵,赖伟,徐盛友..考虑老化进程对热参数影响的IGBT模块寿命评估[J].中国电机工程学报,2017,37(18):5427-5436,10.基金项目
国家自然科学基金资助项目(51477019) （51477019）
国家重点基础研究发展计划项目(973项目)(2012CB25200) （973项目）
中央高校基本科研业务费项目(106112015CDJXY150004)Project Supported by the National Natural Science Foundation of China (51477019) （106112015CDJXY150004）
the National Basic Research Program of China (973 Program)(2012CB25200) （973 Program）
the Fundamental Research Funds for the Central University(106112015CDJXY150004). （106112015CDJXY150004）
