高压电器2017，Vol.53Issue(10)：76-82,7.DOI:10.13296/j.1001-1609.hva.2017.10.013
GIS局部过热故障红外成像技术诊断静态试验研究
Static Test Research on GIS Partial Overheating Fault by Infrared Imaging Technology
摘要
Abstract
To research the diagnosis effectiveness and feasibility of infrared imaging technology on overheating fault inside GIS,a test device to simulate the overheating fault inside GIS is developed by static state test method.The stable temperature rise at different point of GIS enclosure under different fault point temperature is investigated and the function relationship between the temperature rise at GIS enclosure point corresponding to the overheating fault inside GIS and the overheating fault temperature is obtained.The local high temperature on GIS enclosure can be observed by infrared imaging clearly,therefore,the effectiveness and feasibility of this test is verified.The results indicated that when there is an overheating fault inside GIS,the local high temperature on GIS enclosure corresponding to the overheating fault will produce.Take the highest temperature point as origin,the temperature decreases along the axis of GIS,which presents an opening down parabola.From the highest temperature point 0.6 m away,the temperature decreases 11 ℃-15 ℃.The tendency of temperature declines will be slow when excess 0.6 m.The temperature will be ambient temperature when distance excess 3 m.If the highest temperature rise on GIS enclosure is greater than 18.08℃,the overheating fault point inside the GIS corresponding to which may be about 105 ℃.关键词
GIS/红外成像/过热点/温升/外壳Key words
GIS/infrared imaging/overheating point/temperature rise/enclosure引用本文复制引用
李爽,毕海涛,鲁旭臣,洪鹤,李斌,罗斌,赵义松..GIS局部过热故障红外成像技术诊断静态试验研究[J].高压电器,2017,53(10):76-82,7.基金项目
国网辽宁省电力有限公司科技项目(2017YF-39).Project Srpported by Science and Technology Projects of Liaoning Power Limited Corporation of SGCC(2017YF-39). （2017YF-39）
