现代电子技术2017，Vol.40Issue(24)：5-8,4.DOI:10.16652/j.issn.1004-373x.2017.24.002
一种与2D物理设计流程兼容的3D测试基准电路的生成系统
A generation system of 3D testing benchmark circuit compatible with2D physical design flow
摘要
Abstract
A generation system of 3D testing benchmark circuit compatible with 2D physical design flow is proposed. The IBM-PLACE testing benchmark circuit is used as the test example for the transformation experiment to provide a set of 3D testing reference circuit. The system can transform the different input files into the corresponding Bookshelf library files or DEF library files,and realize the automatic transformation of the connection information of the circuit's interconnection nets,standard cell size,port information,standard cell coordinate information and layout information in the physical design library. It can trans-form the arbitrary 2D circuit design into the 3D testing benchmark circuit,is compatible with the physical design flow of the 2D integrated circuit,and can be used in the locating and wiring in traditional physical design EDA tools. The self-customized 3D testing benchmark circuit is realized.关键词
DEF库/Bookshelf库/测试基准电路/自定制/3D集成电路Key words
DEF library/Bookshelf library/testing benchmark circuit/self-customization:three-dimensional integrated cir-cuit分类
信息技术与安全科学引用本文复制引用
侯立刚,杨扬,叶彤旸,彭晓宏,耿淑琴..一种与2D物理设计流程兼容的3D测试基准电路的生成系统[J].现代电子技术,2017,40(24):5-8,4.基金项目
北京市自然科学基金(4152004) （4152004）
国家自然科学基金(61204040) （61204040）
