单片机与嵌入式系统应用2017，Vol.17Issue(11)：27-29,33,4.
TMS570的ECC逻辑自诊断机制与实现方法
ECC Logic Self-diagnosis Mechanism and Realization Method Based on TMS570
刘骋程 1宗凯1
作者信息
- 1. 南京康尼机电股份有限公司,南京210018
- 折叠
摘要
Abstract
A self-diagnosis procedure of ECC detection logic and protection mechanism targeting TMS570 is designed,which included RAM,Flash,FMC and FEE regions.By configuring the MCU internal registers,ECC error can be created intemionally.Then,the logic can be self-diagnosed.This approach is proved to be effective by online test and observation.This method can dramatically improve the validity and integrity of program and data,in addition,the safety of product can be guaranteed.关键词
MCU/TMS570/ECC/自诊断/安全关键系统Key words
MCU/TMS570/ECC/self-diagnosis/safety critical systems分类
计算机与自动化引用本文复制引用
刘骋程,宗凯..TMS570的ECC逻辑自诊断机制与实现方法[J].单片机与嵌入式系统应用,2017,17(11):27-29,33,4.
