航天器工程2017，Vol.26Issue(6)：132-136,5.DOI:10.3969/j.issn.1673-8748.2017.06.021
高分三号卫星X频段固放寿命试验方案设计与验证
Design and Verification of Longevity Test Scheme of X-band SSPA for GF-3 Satellite
摘要
Abstract
In this paper,the factors influencing X-band solid state power amplifier(SSPA)life are analyzed.For the use of GF-3 satellites,the key validation items during its lifetime have been an-alyzed,then three tests are conducted to verity the switching circuit,microwave high-power cir-cuit and typical technology.The test for microwave high-power circuit used thermal stress as an acceleration element,the Arrhenius model had been used to calculate the acceleration factor.The conductive adhesive had been selected for the typical process and the Confin-Manson model had been used to analyze its reliability.Through thee relevant life tests,the domestic X-band 10W SSPA of more than 8 years life on-orbit had been proved.关键词
高分三号卫星/X频段固放/寿命验证/热应力/Arrhenius模型/Confin-Manson模型Key words
GF-3 satellite/X-band SSPA/longevity test/thermal stress/Arrhenius model/Confin-Manson model分类
信息技术与安全科学引用本文复制引用
张高磊,吴言沛,胡晓曦..高分三号卫星X频段固放寿命试验方案设计与验证[J].航天器工程,2017,26(6):132-136,5.基金项目
国家重大科技专项工程 （）
