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PS-VA模式中RM残留量对信赖性的影响

贵丽红 池宝林 赵国 高红茹 温刚 李正强 舒克伦 梁瑞祥

液晶与显示2017,Vol.32Issue(10):799-803,5.
液晶与显示2017,Vol.32Issue(10):799-803,5.DOI:10.3788/YJYXS20173210.0799

PS-VA模式中RM残留量对信赖性的影响

Impact on image sticking of residual reactive mesogen in PS-VA mode

贵丽红 1池宝林 2赵国 2高红茹 1温刚 1李正强 1舒克伦 1梁瑞祥1

作者信息

  • 1. 河北省平板显示材料工程技术研究中心/石家庄诚志永华显示材料有限公司 ,河北石家庄050091
  • 2. 深圳华星光电技术有限公司 ,广东深圳518132
  • 折叠

摘要

Abstract

Well known PS-VA technology has been extensively used for TV application ,but the image sticking issue is still a concern .In order to improve the image sticking performance of PS-VA TV pan-el ,the condition of both UV1 and UV2 process are investigated to find out the relationship between the residual amount of RM and the image sticking performance .It show s that the image sticking per-formance is related to the RM residual amount .As we know ,ion density is a factor of image sticking issue .Based on analysis on the relationship between ion density and RM residual amount ,we develop a new technology to reduce the image sticking issue in PS-VA mode .Furthermore ,another method is provided in this work to improve the image sticking performance by designing a new LC host mixture which has lower residual amount of RM .The technical data is obtained including ion density data measured by Toyo 6254 and surface profile investigation by SEM and AFM .

关键词

PS-VA/残像/RM残留量/离子浓度/液晶

Key words

PS-VA/image sticking/RM residual amount/ion density/liquid crystal

分类

信息技术与安全科学

引用本文复制引用

贵丽红,池宝林,赵国,高红茹,温刚,李正强,舒克伦,梁瑞祥..PS-VA模式中RM残留量对信赖性的影响[J].液晶与显示,2017,32(10):799-803,5.

液晶与显示

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