理化检验-物理分册2018，Vol.54Issue(1)：32-35,42,5.DOI:10.11973/lhjy-wl201801008
扫描电子显微镜在光伏原辅材料检验中的应用
Application of Scanning Electron Microscope in Inspection of Photovoltaic Raw and Auxiliary Materials
摘要
Abstract
Several kinds of photovoltaic raw and auxiliary materials were tested and analyzed by scanning electron microscope,such as coating glass,silicon wafers,welding strips and back sheets.The application of scanning electron microscope in different fields were introduced respectively, including structure observation, measurement of layers of coating glass,analysis on surface morphology and space measurement of silicon wafers, micro analysis on the welding strip surface,type distinguish and thickness measurement of back sheets.The results could provide reference for the research and test of photovoltaic raw and auxiliary materials,such as performance research of coating glass,process optimization analysis of solar cells,performance evaluation of welding strips, inspection and identification of backsheets.关键词
扫描电子显微镜/光伏原辅材料/镀膜玻璃/硅片/焊带/背板Key words
scanning electron microscope/photovoltaic raw and auxiliary material/coating glass/silicon wafer/welding strip/back sheet分类
机械制造引用本文复制引用
黄艳萍,刘毅,朱晓岗,孟庆法,单演炎,卢佳妍..扫描电子显微镜在光伏原辅材料检验中的应用[J].理化检验-物理分册,2018,54(1):32-35,42,5.基金项目
江苏省质量技术监督局科技资助项目(KJ155434) （KJ155434）
