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Spindt阴极可靠性物理问题

廖复疆

真空电子技术Issue(6):7-11,38,6.
真空电子技术Issue(6):7-11,38,6.

Spindt阴极可靠性物理问题

The Physics of the Reliability for Spindt Cathode

廖复疆1

作者信息

  • 1. 北京真空电子技术研究所大功率微波电真空器件技术国防科技重点实验室,北京100015
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摘要

Abstract

The reliability improvement for Spindt cathode are discussed in this paper.The Schotteky diodes in Spindt cathodes are the sources for flashover along oxide walls in cathode cavities.Therefore,move the Schotteky diodes out of Spindt cathodes will improve the Spindt cathodes reliability.The Gray and Green molding process method can be used to make micro-tip array cathode on the metal substrate.Our and other group experiments show that high emission current could be obtained from this cathode and its life time also can be prolonged.

关键词

Spindt阴极/场致发射/肖特基二极管

Key words

Spindt cathode/Field emission/Schotteky diode

分类

信息技术与安全科学

引用本文复制引用

廖复疆..Spindt阴极可靠性物理问题[J].真空电子技术,2017,(6):7-11,38,6.

基金项目

大功率微波电真空器件技术国防科技重点实验室军用电子预研基金项目(614280702011701) (614280702011701)

真空电子技术

1002-8935

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