原子能科学技术2018，Vol.52Issue(2)：199-203,5.DOI:10.7538/yzk.2018.52.02.0199
用于双离子束注入器的杂质消除系统
Study on Impurity Elimination System for Dual-beam Accelerator
摘要
Abstract
A set of impurity elimination system for dual-beam accelerator was developed.This system consists of two Wien filters,one Einzel lens and a slit with two apertures.The two ion beams with different mass-to-charge ratios can be generated in the same ion source and transported in the same beam line simultaneously without impurity.The impurity ions can be eliminated by the slit after the first Wien filter.The beams of H+2 and He+can be produced simultaneously and injected into the target coaxially.The pu-rity of the ion beam on the target is better than 99.9%.关键词
注入器/双离子束/杂质Key words
accelerator/dual-beam/impurity分类
能源科技引用本文复制引用
唐兵,冉广,马鹰俊,黄子敬,马燮,王鲁闽,马瑞刚,李宁,陈立华,曹留煊,黄青华,张建,崔保群..用于双离子束注入器的杂质消除系统[J].原子能科学技术,2018,52(2):199-203,5.基金项目
国家自然科学基金资助项目(11227804,11475270) （11227804,11475270）
