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SRAM-FPGA抗单粒子翻转方法和预估

郭强 刘波 司圣平 刘辉 蒋应富 张恒

西安电子科技大学学报(自然科学版)2018,Vol.45Issue(1):112-116,5.
西安电子科技大学学报(自然科学版)2018,Vol.45Issue(1):112-116,5.DOI:10.3969/j.issn.1001-2400.2018.01.020

SRAM-FPGA抗单粒子翻转方法和预估

SRAM-FPGA SEU mitigation method and prediction

郭强 1刘波 2司圣平 2刘辉 2蒋应富 2张恒2

作者信息

  • 1. 上海航天技术研究院,上海201109
  • 2. 上海卫星工程研究所,上海201109
  • 折叠

摘要

Abstract

In order to solve the problem of Xilinx SRAM-FPGA Single Event Upsets(SEU) in the satellite communication system,we design a less hardware resource and high timeliness method of using the Actel FPGA as the detecting chip.The PROM chip stores the mask bit,reads the Xilinx FPGA configuration file through JTAG and verifies the error.Then it reloads the configuration file to eliminate the SEU effect.The method is successfully applied to a satellite communication system.In order to calculate the reliability of the satellite communication system,the FOM method is used to predict the SEU rate in SRAM FPGA.The results show that this method can be used to calculate the SEU rate in the orbit.And the results can be used to predict the SEU rate in the other SRAM FPGA and Memory,and to provide reference for reliability research and design of China's satellite communication system.

关键词

静态随机存储器型现场可编程门阵列/单粒子翻转/抗单粒子翻转方法/单粒子翻转率预估

Key words

static random access memory-field programmable gate array/single event upsets/single event upset mitigation method/single event upset rate prediction

分类

航空航天

引用本文复制引用

郭强,刘波,司圣平,刘辉,蒋应富,张恒..SRAM-FPGA抗单粒子翻转方法和预估[J].西安电子科技大学学报(自然科学版),2018,45(1):112-116,5.

西安电子科技大学学报(自然科学版)

OA北大核心CSCDCSTPCD

1001-2400

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