液晶与显示2018，Vol.33Issue(2)：123-128,6.DOI:10.3788/YJYXS20183302.0123
基于DOE的TFT-LCD切换残影不良改善研究
Improvement of TFT-LCD image-retention based on DOE
陶雄 1王云志 1李莹 1杨德波 1何云川1
作者信息
- 1. 重庆京东方光电科技有限公司,重庆400714
- 折叠
摘要
Abstract
To reduce the occurrence of TFT-LCD image-retention,several key factors were approved with fractional factorial design adopting the design of experiment (DOE).Through the practical pro-duction,we solved the problem about the image-retention.The results showed that the prominent fac-tors of image-retention,including OC,OL and Rubbing Torque,can be effectively distinguished by DOE method.Moreover,by adding OC on CF,enlarging and ITO-Vcom Overlay,or increasing Rub-bing Torque value,the incidence of image-retention during improvement can be effectively reduced. This study provided a new idea for other defect researches in image-retention and TFT-LCD production process.关键词
切换残影/实验设计/覆盖层/重叠层/摩擦扭转力Key words
image-retention/design of experiment/over coater/overlay/rubbing torque分类
信息技术与安全科学引用本文复制引用
陶雄,王云志,李莹,杨德波,何云川..基于DOE的TFT-LCD切换残影不良改善研究[J].液晶与显示,2018,33(2):123-128,6.
