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基于轮廓提取的电路板缺陷检测

刘西锋 胡玉薇

机械制造与自动化Issue(2):171-174,4.
机械制造与自动化Issue(2):171-174,4.DOI:10.19344/j.cnki.issn1671-5276.2018.02.047

基于轮廓提取的电路板缺陷检测

PCB Defect Inspection Based on Contour Extraction

刘西锋 1胡玉薇1

作者信息

  • 1. 北京京仪仪器仪表研究总院有限公司,北京100078
  • 折叠

摘要

Abstract

The defect inspection system of multilayer printed circuit boards based on contour extraction is designed on the basis of industrial computer laminography. It meets the requirements of its high efficiency and high precision in industry field. The Hough transformation is used to detect the location of the circle center on the target picture, and then the target image is adjusted to the standard image with geometric registration.The defect types of PCB are discussed.The contour extraction with pattern recognition is applied to the positions and classes of the defects.It is difficult to get a full and accurate circuit image of every layer and the position of the defects using the DR method and AOI scanning methods.

关键词

印刷电路板/缺陷检测/轮廓提取/图像配准

Key words

multilayer printed circuit boards/defect inspection/image registration/contour extraction

分类

通用工业技术

引用本文复制引用

刘西锋,胡玉薇..基于轮廓提取的电路板缺陷检测[J].机械制造与自动化,2018,(2):171-174,4.

基金项目

国家重大科学仪器设备开发专项(2014YQ240445) (2014YQ240445)

机械制造与自动化

OACSTPCD

1671-5276

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