液晶与显示2018，Vol.33Issue(3)：221-227,7.DOI:10.3788/YJYXS20183303.0221
基于改进Otsu算法的TFT-LCD点缺陷自动光学检测系统
Automatic optical detection system for TFT-LCD spot-type defect based on improved Otsu algorithm
摘要
Abstract
In order to solve the problem that the traditional threshold segmentation algorithm is diffi-cult to detect the spot-type defect from low contrast background,an improved Otsu algorithm is pro-posed.Based on this,a TFT-LCD spot-type defect automatic optical detection system is constructed. First,the effect of texture background is removed by Gabor filtering.Then,Using the different distri-bution characteristics of Weibull distribution function when the shape parameter of the Weibull func-tion is segmented,the threshold extraction function of traditional Otsu is improved.Finally,offline test and online test are carried out.The experiment shows that the improved Otsu algorithm can produce better detection result than the traditional Otsu algorithm in the case of low contrast between defects and background.The algorithm is transplanted to the TFT-LCD spot-type defect automatic op-tical detection hardware platform to test.The correct detection rate can reach 94% and the detection time can be shortened to 150 ms.It reduces the workload and labor intensity of TFT-LCD manual spot-type defect detection.关键词
点缺陷检测/TFT-LCD/改进的Otsu算法/自动光学检测系统Key words
spot-type defect detection/TFT-LCD/improved Otsu algorithm/automatic optical detection system分类
信息技术与安全科学引用本文复制引用
郭波,管菊花,黄志开..基于改进Otsu算法的TFT-LCD点缺陷自动光学检测系统[J].液晶与显示,2018,33(3):221-227,7.基金项目
国家自然科学基金(No.61472173) （No.61472173）
江西省科技厅重点研发计划(No.20151BBE50083)Supported by National Natural Supported by Science Foundation of China(No.61472173) （No.20151BBE50083）
Key Research and Development Program of Jiangxi Province of China(No.20151BBE50083) （No.20151BBE50083）
