液晶与显示2018，Vol.33Issue(4)：277-284,8.DOI:10.3788/YJYXS20183304.0277
TFT-LCD公共电压耦合畸变的影响因素及与线残像关系的研究
Influencing factors of TFT-LCD common voltage on the coupling of signal voltage and the relationship with line image sticking
林鸿涛 1陈曦 1庄子华 1赖意强 1袁剑峰 2邵喜斌3
作者信息
- 1. 福州京东方光电科技有限公司,福建福州 350300
- 2. 重庆京东方光电科技有限公司,重庆 400714
- 3. 京东方科技集团股份有限公司,北京 100176
- 折叠
摘要
Abstract
In order to solve the line image sticking issue of TFT-LCD,the data of coupling voltage be-tween the data lines and the common electrode as well as the influencing factors were studied.By using metal welding technology,the common voltage(Vcom)distortion induced by signal voltage was measured and compared with the severity of the line image sticking.At the same time,the different influencing factors such as the mask design,the amplitude and frame change frequency of the signal, the TFT process and the adjustment of the film characters were studied respectively.The results showed that the change of the stray capacitance between the data lines and common electrode caused the Vcomdistortion,which is corresponding to the line image sticking.Altering the permittivity or di-mensions of the amorphous silicon layer can decrease the stray capacitance(including the overlap ca-pacitance between the data lines and common voltage lines,and the side capacitance between the data lines and the common electrode within the pixels),so the Vcomdistortion can be lowered and the line image sticking improved.Among the solutions,rising the frame change frequency or irradiating the amorphous silicon layer with UV have the best results,which the Vcomdistortions were fallen down by 55% and 62%,and the gray level that the line image sticking vanished was turned down from L127 to below L127.The research achievements could be the important guide and reference to the new TFT-LCD with large size,high resolution,high brightness and low power consumption.关键词
公共电极电压畸变/交叠和侧向电容/介电常数/线残像Key words
common voltage distortion(Vcomdistortion)/overlap and side capacitance/permittivity/line image sticking分类
信息技术与安全科学引用本文复制引用
林鸿涛,陈曦,庄子华,赖意强,袁剑峰,邵喜斌..TFT-LCD公共电压耦合畸变的影响因素及与线残像关系的研究[J].液晶与显示,2018,33(4):277-284,8.
