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金属氧化物TFT阈值对LCD显示屏可靠性的影响

楼均辉 姜姝 吴天一 符鞠建 夏兴达 何泽尚 迟宵 应变 李喜峰

发光学报2018,Vol.39Issue(3):383-387,5.
发光学报2018,Vol.39Issue(3):383-387,5.DOI:10.3788/fgxb20183903.0383

金属氧化物TFT阈值对LCD显示屏可靠性的影响

Effect of Threshold-voltage of Oxide-TFT on The Reliability of LCD Display

楼均辉 1姜姝 2吴天一 1符鞠建 1夏兴达 1何泽尚 1迟宵 1应变 1李喜峰2

作者信息

  • 1. 天马微电子集团,上海 201205
  • 2. 上海大学 新型显示技术及应用集成教育部重点实验室,上海 200072
  • 折叠

摘要

Abstract

The characteristics of TFT are critical to the reliability of metal oxide-TFT drived LCD. The effect of Vthand stability of oxide-TFT to the reliability of narrow-bezel LCD display were re-searched. The negative Vthof the normal-on oxide-TFT can result in the failure of VSR scan circuits. Others,the negative-shift of the Vthof TFT in pixel at high temperature and under back-light illumi-nation can cause the Vthnegative shift and results in the cross-talk or image-sticking because of the high leakage current of TFT.

关键词

金属氧化物薄膜晶体管/阈值/LCD/可靠性

Key words

oxide TFT/threshold-voltage(Vth)/LCD/reliability

分类

信息技术与安全科学

引用本文复制引用

楼均辉,姜姝,吴天一,符鞠建,夏兴达,何泽尚,迟宵,应变,李喜峰..金属氧化物TFT阈值对LCD显示屏可靠性的影响[J].发光学报,2018,39(3):383-387,5.

基金项目

国家高技术研究发展计划(863)(2015AA033406) (863)

上海市科委项目(16JC1400602,17DZ2291500)资助 Supported by National High Technology Research and Development Program of China(863)(2015AA033406) (16JC1400602,17DZ2291500)

Science and Technology Commission of Shanghai Municipality(16JC1400602,17DZ2291500) (16JC1400602,17DZ2291500)

发光学报

OA北大核心CSCDCSTPCD

1000-7032

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