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An advanced SEU tolerant latch based on error detection

Hui Xu Jianwei Zhu Xiaoping Lu Jingzhao Li

半导体学报（英文版）2018，Vol.39Issue(5)：77-80,4.

半导体学报（英文版）2018，Vol.39Issue(5)：77-80,4.DOI:10.1088/1674-4926/39/5/055003

An advanced SEU tolerant latch based on error detection

Hui Xu ¹Jianwei Zhu ²Xiaoping Lu ³Jingzhao Li³

作者信息

1. School of Computer Science and Engineering, Anhui University of Science and Technology, Huainan 232001, China
2. Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin 78712, USA
3. School of Electrical and Information Engineering, Anhui University of Science and Technology, Huainan 232001, China
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摘要

关键词

single event upset (SEU)/latch/error detection/stacked

Key words

single event upset (SEU)/latch/error detection/stacked

引用本文复制引用

Hui Xu,Jianwei Zhu,Xiaoping Lu,Jingzhao Li..An advanced SEU tolerant latch based on error detection[J].半导体学报（英文版）,2018,39(5):77-80,4.

基金项目

Project supported by the National Natural Science Foundation of China (Nos.61404001,61306046),the Anhui Province University Natural Science Research Major Project (No.KJ2014ZD12),the Huainan Science and Technology Program (No.2013A4011),and the National Natural Science Foundation of China (No.61371025). （Nos.61404001,61306046）

半导体学报（英文版）

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ISSN：1674-4926

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