航天器环境工程2018，Vol.35Issue(3)：247-251,5.DOI:10.3969/j.issn.1673-1379.2018.03.008
基于Arrhenius模型的星载电子产品加速寿命试验技术
Accelerated life test technology for satellite electronic products based on Arrhenius model
摘要
Abstract
To meet the requirement of the eight-year long life in-orbit data processing for the GF-3 satellite, an accelerated life test should be carried out to validate the reliability design of the onboard data processing unit (DPU). In this paper, a method based on the Arrhenius model is adopted to estimate the accelerating factor of the onboard DPU. The scheme design of the accelerated life test is described. The failure criteria are proposed with suggested measures, as well as the endurance criteria at the end of the lifetime. It is shown that all functions and performances of the DPU of the GF-3 satellite during and after the test meet the technical specifications. In a conclusion, the accelerated life test technology is an effective way to estimate the reliability of the onboard satellite products in a short time with a low cost, thus it can be widely applied in the design of aerospace electronic products in the future.关键词
"高分三号"卫星/数据处理单元/加速寿命试验/Arrhenius模型/可靠性评估Key words
GF-3 satellite/data process unit/accelerated life test/Arrhenius model/reliability assessment分类
航空航天引用本文复制引用
王文平,王向晖,张庆君,董杰,尚山,田巍..基于Arrhenius模型的星载电子产品加速寿命试验技术[J].航天器环境工程,2018,35(3):247-251,5.基金项目
国家重大科技专项工程 （）
