四川环境2018，Vol.37Issue(3)：125-130,6.
半导体γ谱仪的期间核查和质量控制方法探讨
Discussion on the Period Verification and Quality Control Method of Semiconductor γ Spectrometer
庞荣华1
作者信息
- 1. 四川省辐射环境管理监测中心站,成都 611139
- 折叠
摘要
Abstract
The objective of using the method of period verification and quality control is to verify and ensure the stability and reliability of the low background semiconductor gamma spectrometer and then to make sure the quality and accuracy of the test data. In this study, the resolution, short-term stability, efficiency and activity of the low-background high-purity germanium gamma spectrometer GR8023 are tested with different standard sources, and the measurement performance of GR8023 is compared to that of the semiconductor gamma spectrometer specified in JJG417-2006. 10 to 20 times background counts at the same time interval are measured for Poisson distribution test. The background count and the detection efficiency of the same standard source of the instrument for one yearare counted, and the quality control charts of the background andlong-term stability of the detection efficiency are plotted respectively. The results showed thatthe main measurement indexes of the low-background high-purity germanium gamma spectrometer GR8023 meet the requirements. The short-term stability is in compliance with the Poisson distribution, and the background count rate and detection efficiency measurement values are all within the warning scope of the quality control chart. During a verification period, the period verificationresults of the low-background high-purity germanium gamma spectrometer GR8023 are qualified. The short-term and long-term stability both meet the requirements. The instrument is stable and meets the requirements of the test work.关键词
半导体γ 谱仪/期间核查/质量控制措施Key words
Semiconductorγspectrometer/period verification/quality control methods分类
医药卫生引用本文复制引用
庞荣华..半导体γ谱仪的期间核查和质量控制方法探讨[J].四川环境,2018,37(3):125-130,6.
