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Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage

Zang Sicong Pi Dechang

南京航空航天大学学报（英文版）2018，Vol.35Issue(3)：455-463,9.

Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage

Zang Sicong ¹Pi Dechang¹

作者信息

1. College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics,Nanjing 211106, P.R.China
折叠

摘要

关键词

software reliability/testing-effort/testing coverage/imperfect debugging(ID)/non-homogeneous Poisson process (NHPP)

Key words

software reliability/testing-effort/testing coverage/imperfect debugging(ID)/non-homogeneous Poisson process (NHPP)

分类

信息技术与安全科学

引用本文复制引用

Zang Sicong,Pi Dechang..Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage[J].南京航空航天大学学报（英文版）,2018,35(3):455-463,9.

基金项目

This work was supported by the National Natural Science Foundation of China (No.U1433116) and the Aviation Science Foundation of China (No.20145752033). （No.U1433116）

南京航空航天大学学报（英文版）

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ISSN：1005-1120

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