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Review on Fault-Tolerant NoC Designs

Jun-Shi Wang Le-Tian Huang

电子科技学刊2018，Vol.16Issue(3)：191-221,31.

电子科技学刊2018，Vol.16Issue(3)：191-221,31.DOI:10.11989/JEST.1674-862X.71128019

Review on Fault-Tolerant NoC Designs

Jun-Shi Wang ¹Le-Tian Huang²

作者信息

1. School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731
2. Beijing Zhaoxin Electronic Technology Co., Ltd., Beijing 100084
折叠

摘要

关键词

Fault diagnosis/fault recovery/fault-tolerant/network-on-chip

Key words

Fault diagnosis/fault recovery/fault-tolerant/network-on-chip

引用本文复制引用

Jun-Shi Wang,Le-Tian Huang..Review on Fault-Tolerant NoC Designs[J].电子科技学刊,2018,16(3):191-221,31.

基金项目

This paper was supported by the National Natural Science Foundation of China under Grants No. 61534002, and No. 61701095, and the Fundamental Research Funds for the Central Universities under Grant No. ZYGX2016J042. （）

电子科技学刊

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ISSN：1674-862X

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