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Model of NBTI combined with mobility degradation

Xuezhong Wu Chenyue Ma Shucheng Gao Xiangbin Li Fu Sun Lining Zhang Xinnan Lin

半导体学报（英文版）2018，Vol.39Issue(12)：141-146,6.

半导体学报（英文版）2018，Vol.39Issue(12)：141-146,6.DOI:10.1088/1674-4926/39/12/124015

Model of NBTI combined with mobility degradation

Xuezhong Wu ¹Chenyue Ma ¹Shucheng Gao ¹Xiangbin Li ¹Fu Sun ¹Lining Zhang ²Xinnan Lin¹

作者信息

1. The Shenzhen Key Lab of Advanced Electron Device and Integration,ECE,PKUSZ,Shenzhen 518060,China
2. College of Electronic Science and Technology,Shenzhen University,Shenzhen 518060,China
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摘要

关键词

NBTI/mobility degradation/aging simulation algorithm/hot carrier injection/self-heating effect/coupling

Key words

NBTI/mobility degradation/aging simulation algorithm/hot carrier injection/self-heating effect/coupling

引用本文复制引用

Xuezhong Wu,Chenyue Ma,Shucheng Gao,Xiangbin Li,Fu Sun,Lining Zhang,Xinnan Lin..Model of NBTI combined with mobility degradation[J].半导体学报（英文版）,2018,39(12):141-146,6.

基金项目

Project supported by the Shenzhen Science and Technology Project (Nos.ZDSYS201703031405137,JCYJ20170810163407761,(JCYJ20170818114156474),the PhD Start-up Fund of Natural Science Foundation of Guangdong Province (No.2015A030310499),and the China Postdoctoral Science Foundation Funded Project (No.2015T80023). （Nos.ZDSYS201703031405137,JCYJ20170810163407761,(JCYJ20170818114156474）

半导体学报（英文版）

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ISSN：1674-4926

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