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2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps

A.Hezabra N.A.Abdeslam N.Sengouga M.C.E.Yagoub

半导体学报(英文版)2019,Vol.40Issue(2):35-40,6.
半导体学报(英文版)2019,Vol.40Issue(2):35-40,6.DOI:10.1088/1674-4926/40/2/022802

2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps

2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps

A.Hezabra 1N.A.Abdeslam 1N.Sengouga 1M.C.E.Yagoub2

作者信息

  • 1. Laboratory of Metallic and Semiconducting Materials(LMSM), Mohammed Khider University, Biskra, Algeria
  • 2. School of Electrical Engineering and Computer Science, University of Ottawa, Ottawa, ON, Canada
  • 折叠

摘要

关键词

AlGaN HEMT/AlGAN/AlN/GaN structure, silicon substrate/Silvaco/trapping effects/channel traps

Key words

AlGaN HEMT/AlGAN/AlN/GaN structure, silicon substrate/Silvaco/trapping effects/channel traps

引用本文复制引用

A.Hezabra,N.A.Abdeslam,N.Sengouga,M.C.E.Yagoub..2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps[J].半导体学报(英文版),2019,40(2):35-40,6.

半导体学报(英文版)

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