现代应用物理2019，Vol.10Issue(2)：42-46,5.DOI:10.12061/j.issn.2095-6223.2019.020602
CCD及CMOS图像传感器的质子位移损伤等效分析
Displacement Damage of CCD and CMOS Image Sensor Induced by Proton
YU Xin 1XUN Ming-zhu 1GUO Qi 1HE Cheng-fa 1LI Yu-dong 1WEN Lin 1ZHANG Xing-yao 1ZHOU Dong1
作者信息
摘要
关键词
位移损伤效应/非电离能量损失/CCD/CMOS分类
信息技术与安全科学引用本文复制引用
YU Xin,XUN Ming-zhu,GUO Qi,HE Cheng-fa,LI Yu-dong,WEN Lin,ZHANG Xing-yao,ZHOU Dong..CCD及CMOS图像传感器的质子位移损伤等效分析[J].现代应用物理,2019,10(2):42-46,5.
