电子科技学刊2020，Vol.18Issue(1)：59-75,17.DOI:10.1016/j.jnlest.2020.100030
Utilization of Extrinsic Fabry-Perot Interferometers with Spectral Interferometric Interrogation for Microdisplacement Measurement
Utilization of Extrinsic Fabry-Perot Interferometers with Spectral Interferometric Interrogation for Microdisplacement Measurement
Leonid Liokumovich 1Aleksandr Markvart 1Nikolai Ushakov1
作者信息
- 1. the Higher School of Applied Physics and Space Technologies, Peter the Great St. Petersburg Polytechnic University, St. Petersburg 195251
- 折叠
摘要
关键词
Absolute measurement/dynamic measurement/Fabry-Perot interferometer/least-squares methods/optical fiber sensors/resolution analysis/resolution enhancement/sensor multiplexing/spectral interferometryKey words
Absolute measurement/dynamic measurement/Fabry-Perot interferometer/least-squares methods/optical fiber sensors/resolution analysis/resolution enhancement/sensor multiplexing/spectral interferometry引用本文复制引用
Leonid Liokumovich,Aleksandr Markvart,Nikolai Ushakov..Utilization of Extrinsic Fabry-Perot Interferometers with Spectral Interferometric Interrogation for Microdisplacement Measurement[J].电子科技学刊,2020,18(1):59-75,17.
