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首页|期刊导航|半导体学报(英文版)|Low-cost dual-stage offset-cancelled sense amplifier with hybrid read reference generator for improved read performance of RRAM at advanced technology nodes

Low-cost dual-stage offset-cancelled sense amplifier with hybrid read reference generator for improved read performance of RRAM at advanced technology nodes

Qiao Wang Donglin Zhang Yulin Zhao Chao Liu Xiaoxin Xu Jianguo Yang Hangbing Lv

半导体学报(英文版)2021,Vol.42Issue(8):63-68,6.
半导体学报(英文版)2021,Vol.42Issue(8):63-68,6.DOI:10.1088/1674-4926/42/8/082401

Low-cost dual-stage offset-cancelled sense amplifier with hybrid read reference generator for improved read performance of RRAM at advanced technology nodes

Low-cost dual-stage offset-cancelled sense amplifier with hybrid read reference generator for improved read performance of RRAM at advanced technology nodes

Qiao Wang 1Donglin Zhang 2Yulin Zhao 1Chao Liu 2Xiaoxin Xu 1Jianguo Yang 2Hangbing Lv1

作者信息

  • 1. Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China
  • 2. University of Chinese Academy of Sciences,Beijing 100049,China
  • 折叠

摘要

关键词

RRAM/double sensing margin/device mismatch cancellation/nonlinearity of RRAM resistance/hybrid reference-cell

Key words

RRAM/double sensing margin/device mismatch cancellation/nonlinearity of RRAM resistance/hybrid reference-cell

引用本文复制引用

Qiao Wang,Donglin Zhang,Yulin Zhao,Chao Liu,Xiaoxin Xu,Jianguo Yang,Hangbing Lv..Low-cost dual-stage offset-cancelled sense amplifier with hybrid read reference generator for improved read performance of RRAM at advanced technology nodes[J].半导体学报(英文版),2021,42(8):63-68,6.

基金项目

This work was supported in part by the National Key R&D Program of China under Grant No.2019YFB2204800 and in part by the Major Scientific Research Project of Zhejiang Lab(Grant No.2019KCOAD02)and in part by the National Natur-al Science Foundation of China under Grants 61904200 and the Strategic Priority Research Program of the Chinese Academy of Sciences under Grant No.XDB44000000. (Grant No.2019KCOAD02)

半导体学报(英文版)

OACSCDCSTPCDEI

1674-4926

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