半导体学报（英文版）2021，Vol.42Issue(8)：87-91,5.DOI:10.1088/1674-4926/42/8/084101
Reliability evaluation on sense-switch p-channel flash
Reliability evaluation on sense-switch p-channel flash
Side Song 1Guozhu Liu 1Hailiang Zhang 2Lichao Chao 1Jinghe Wei 1Wei Zhao 1Genshen Hong 1Qi He1
作者信息
- 1. The 58th Institution of Electronic Science and Technology Group Corporation of China,Wuxi 214035,China
- 2. School of Electronic Science and Engineering, Southeast University, Nanjing 210096, China
- 折叠
摘要
关键词
reliability/endurance/data retention/sense-switch p-channel flashKey words
reliability/endurance/data retention/sense-switch p-channel flash引用本文复制引用
Side Song,Guozhu Liu,Hailiang Zhang,Lichao Chao,Jinghe Wei,Wei Zhao,Genshen Hong,Qi He..Reliability evaluation on sense-switch p-channel flash[J].半导体学报（英文版）,2021,42(8):87-91,5.
