首页|期刊导航|光:科学与应用(英文版)|Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
Peng Yin Gong-Chu Li Jin-Shi Xu Zong-Quan Zhou Lijian Zhang Geng Chen Chuan-Feng Li Guang-Can Guo Wen-Hao Zhang Liang Xu Ze-Gang Liu Wei-Feng Zhuang Lei Chen Ming Gong Yu Ma Xing-Xiang Peng
光:科学与应用(英文版)2021,Vol.10Issue(6):1070-1077,8.
光:科学与应用(英文版)2021,Vol.10Issue(6):1070-1077,8.
Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
摘要
引用本文复制引用
Peng Yin,Gong-Chu Li,Jin-Shi Xu,Zong-Quan Zhou,Lijian Zhang,Geng Chen,Chuan-Feng Li,Guang-Can Guo,Wen-Hao Zhang,Liang Xu,Ze-Gang Liu,Wei-Feng Zhuang,Lei Chen,Ming Gong,Yu Ma,Xing-Xiang Peng..Improving the precision of optical metrology by detecting fewer photons with biased weak measurement[J].光:科学与应用(英文版),2021,10(6):1070-1077,8.基金项目
This work was supported by the National Key Research and Development Program of China(Nos.2017YFA0304100,2016YFA0302700),National Natural Science Foundation of China(Grant Nos.11874344,92065107,61835004,11774335,91536219,11821404),Key Research Program of Frontier Sciences,CAS(No.QYZDY-SSW-SLH003),Anhui Initiative in Quantum Information Technologies(AHY020100,AHY060300),the Fundamental Research Funds for the Central Universities(Grant Nos.WK2030020019,WK2470000026),Science Foundation of the CAS(No.ZDRW-XH-2019-1). (Nos.2017YFA0304100,2016YFA0302700)