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High-resolution 1D moire s as counterfeit security features

Victor J Cadarso Sylvain Chosson Katrin Sidler Roger D Hersch Jurgen Brugger

光：科学与应用（英文版）2013，Vol.2Issue(1)：P.119-123,5.
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光：科学与应用（英文版）2013，Vol.2Issue(1)：P.119-123,5.DOI:10.1038/lsa.2013.42

High-resolution 1D moire s as counterfeit security features

Victor J Cadarso 1Sylvain Chosson 2Katrin Sidler 1Roger D Hersch 2Jurgen Brugger1

作者信息

  • 1. Microsystems laboratory,Ecole Polytechnique Federale de Lausanne(EPFL),Lausanne 1015,Switzerland
  • 2. Peripheral Systems Laboratory,EPFL,Lausanne 1015,Switzerland
  • 折叠

摘要

关键词

anti-counterfeiting/micro-optical devices/moire´effect/optical security

分类

信息技术与安全科学

引用本文复制引用

Victor J Cadarso,Sylvain Chosson,Katrin Sidler,Roger D Hersch,Jurgen Brugger..High-resolution 1D moire s as counterfeit security features[J].光：科学与应用（英文版）,2013,2(1):P.119-123,5.

基金项目

This work was partially funded by projects 200020-105119/1 and 200021_143501/1 of the Swiss National Science Foundation. （）

光：科学与应用（英文版）

2095-5545

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