电子科技学刊2021,Vol.19Issue(3):233-242,10.DOI:10.1016/j.jnlest.2021.100094
Resolving Deep Sub-Wavelength Scattering of Nanoscale Sidewalls Using Parametric Microscopy
Resolving Deep Sub-Wavelength Scattering of Nanoscale Sidewalls Using Parametric Microscopy
摘要
关键词
Light scattering/nanoscale microscopy/polarization/semiconductorKey words
Light scattering/nanoscale microscopy/polarization/semiconductor引用本文复制引用
Nagendra Parasad Yadav,Ji-Chuan Xiong,Wei-Ping Liu,Wei-Ze Wang,Yun Cao,Ashish Kumar,Xue-Feng Liu..Resolving Deep Sub-Wavelength Scattering of Nanoscale Sidewalls Using Parametric Microscopy[J].电子科技学刊,2021,19(3):233-242,10.基金项目
This work was supported by the National Major Scientific Instruments and Equipment Development Project under Grant No.61827814 ()
the National Natural Science Foundation of China(NSFC)under Grant No.61501239 (NSFC)
the NSFC International Young Scientist Research Fund under Grant No.61750110520 ()
the Hubei Polytechnic University Laboratory Fund under Grant No. 19XJK24R ()
the Jiangsu Postdoc Research Fund under Grant No. 1601001B ()
the Beijing Natural Science Foundation under Grant No.Z190018 ()
the Fundamental Research Funds for the Central Universities under Grant No.30920010011 ()
the UK Engineering and Physical Sciences Research Council under Grant No. EP/R042578/1. ()