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温度对氮化铝表面形貌的调控及演化机理

牛慧丹 王占国 孔苏苏 杨少延 刘祥林 魏鸿源 姚威振 李辉杰 陈庆庆 汪连山

发光学报2021,Vol.42Issue(11):1739-1747,9.
发光学报2021,Vol.42Issue(11):1739-1747,9.DOI:10.37188/CJL.20210287

温度对氮化铝表面形貌的调控及演化机理

Temperature Dependence and Evolution Mechanism of Aluminum Nitride Morphologies

牛慧丹 1王占国 2孔苏苏 1杨少延 1刘祥林 2魏鸿源 1姚威振 2李辉杰 1陈庆庆 1汪连山1

作者信息

  • 1. 中国科学院半导体研究所 半导体材料科学重点实验室,北京 100083
  • 2. 中国科学院大学 材料与光电研究中心,北京 100049
  • 折叠

摘要

Abstract

Aluminum nitride( AlN) is a significant ultra-wide bandgap semiconductor material. This paper studies the surface morphology evolution and growth mechanism of AlN grown on sapphire substrates by hydride vapor phase epitaxy( HVPE) . The morphologies of AlN are controlled by the nitridation pre-treatment and the growth temperature from 750 ℃ to 1100 ℃. The results show that growth temperature played a critical role in the AlN growth of mor-phology and growth mode. The difference in nanoscale or microscale morphologies of AlN is attributed to the surface migration of Al adatoms dominated by the growth temperature and the evolution of the dislocation. Moreover, the sur-face morphology evolution leads to an inverted pyramid morphology or large V-shaped pits at the growth temperature of 900 ℃. The grown V-shaped pits have {10-11} semi-polar facets and follow the three-dimensional(3D) growth mode. The semi-polar facets AlN structure could be used for realizing facet-controlled epitaxial of semi-polar UV-LED or other Ⅲ-nitride growth, which has prospects in optoelectronic and electronic devices.

关键词

超宽禁带半导体材料/氮化铝/氢化物气相外延/生长温度/表面形貌

Key words

ultra-wide bandgap semiconductor/aluminum nitride/hydride vapor phase epitaxy/growth tempera-ture/surface morphology

分类

数理科学

引用本文复制引用

牛慧丹,王占国,孔苏苏,杨少延,刘祥林,魏鸿源,姚威振,李辉杰,陈庆庆,汪连山..温度对氮化铝表面形貌的调控及演化机理[J].发光学报,2021,42(11):1739-1747,9.

基金项目

国家重点研发计划(2017YFB0404201) (2017YFB0404201)

国家自然科学基金(61774147,61874108)资助项目 (61774147,61874108)

发光学报

OA北大核心CSCDCSTPCD

1000-7032

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