原子能科学技术2021，Vol.55Issue(12)：2282-2289,8.DOI:10.7538/yzk.2021.youxian.0489
SIP外壳内受X射线激发的电磁干扰环境
Simulation of X-ray-induced EMI Environment in Shell of SIP
陈竞晖 1曾超1
作者信息
- 1. 中国工程物理研究院电子工程研究所,四川绵阳 621900
- 折叠
摘要
Abstract
This article aims to evaluate the electromagnetic interference (EMI) environ-ment in the shell of a system in package (SIP) while irradiated by a pulsed X-ray fluecne.First,the yields and energy spectra of photoelectrons induced by X-ray were calculated using Monte Carlo numerical simulations.These results were used to simulate the self-consistent movement of photoelectrons emitting from the Kovar alloy shell and the die-lectrical material of printed circuit board (PCB).The electromagnetic pulse (EMP) gen-erated by these photoelectrons were calculated using finite difference time-domain(FDTD) method and particle-in-cell (PIC) method.An analysis of the EMI environment in the shell of SIP was performed by numerical results.It is shown that the EMI envi-ronment adjacent to the emission surfaces turns more severe because of the movement of photoelectrons.And most of the radiation energy is located at low-frequency parts,which depends on the characteristic time of X-ray.Also,reducing the area of surfaces illuminated by X-ray and the height of SIP can lessen the threat from EMI.关键词
系统级封装/电磁干扰/X射线Key words
system in package/electromagnetic interference/X-ray分类
信息技术与安全科学引用本文复制引用
陈竞晖,曾超..SIP外壳内受X射线激发的电磁干扰环境[J].原子能科学技术,2021,55(12):2282-2289,8.
