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Retraining Deep Neural Network with Unlabeled Data Collected in Embedded Devices

Hong-Xu Cheng Le-Tian Huang Jun-Shi Wang Masoumeh Ebrahimi

电子科技学刊2022，Vol.20Issue(1)：55-69,15.
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电子科技学刊2022，Vol.20Issue(1)：55-69,15.DOI:10.11989/JEST.1674-862X.90228012

Retraining Deep Neural Network with Unlabeled Data Collected in Embedded Devices

Retraining Deep Neural Network with Unlabeled Data Collected in Embedded Devices

Hong-Xu Cheng 1Le-Tian Huang 1Jun-Shi Wang 2Masoumeh Ebrahimi3

作者信息

  • 1. School of Electronic Sicence and Engineering, University of Electronic Science and Technology of China, Chengdu 611731
  • 2. Beijing Zhaoxin Electronic Technology Co., Ltd, Beijing 100094
  • 3. School of Electrical Engineering and Computer Science, Royal Institute of Technology, Kista, SE-16440
  • 折叠

摘要

关键词

Deep neural network (DNN)/embedded devices/fake label/retraining

Key words

Deep neural network (DNN)/embedded devices/fake label/retraining

引用本文复制引用

Hong-Xu Cheng,Le-Tian Huang,Jun-Shi Wang,Masoumeh Ebrahimi..Retraining Deep Neural Network with Unlabeled Data Collected in Embedded Devices[J].电子科技学刊,2022,20(1):55-69,15.

基金项目

This work was supported by the National Natural Science Foundation of China under Grants No. 61534002, No. 61761136015,and No. 61701095. （）

电子科技学刊

OACSCD

1674-862X

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