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In-situ/operando characterization techniques for organic semiconductors and devices

Sai Jiang Qinyong Dai Jianhang Guo Yun Li

半导体学报:英文版2022，Vol.43Issue(4)：P.13-23,11.

半导体学报:英文版2022，Vol.43Issue(4)：P.13-23,11.DOI:10.1088/1674-4926/43/4/041101

In-situ/operando characterization techniques for organic semiconductors and devices

Sai Jiang ¹Qinyong Dai ²Jianhang Guo ²Yun Li²

作者信息

1. School of Microelectronics and Control Engineering,Changzhou University,Changzhou 213164,China
2. National Laboratory of Solid-State Microstructures,School of Electronic Science and Engineering,Collaborative Innovation Center of Advanced Microstructures,Nanjing University,Nanjing 210093,China
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摘要

关键词

in-situ/operando characterization/organic semiconductors/structure-property relationship

分类

信息技术与安全科学

引用本文复制引用

Sai Jiang,Qinyong Dai,Jianhang Guo,Yun Li..In-situ/operando characterization techniques for organic semiconductors and devices[J].半导体学报:英文版,2022,43(4):P.13-23,11.

基金项目

support from Natural Science Foundation of Jiangsu Province (grant number BK20211507) （grant number BK20211507）

National Natural Science Foundation of China (grant number 61774080) （grant number 61774080）

the start-up funds from Changzhou University。（）

半导体学报:英文版

OACSCDCSTPCDEI

ISSN：1674-4926

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