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Study of structure-property relationship of semiconductor nanomaterials by off-axis electron holography

Luying Li Yongfa Cheng Zunyu Liu Shuwen Yan Li Li Jianbo Wang Lei Zhang Yihua Gao

半导体学报:英文版2022，Vol.43Issue(4)：P.36-45,10.

半导体学报:英文版2022，Vol.43Issue(4)：P.36-45,10.DOI:10.1088/1674-4926/43/4/041103

Study of structure-property relationship of semiconductor nanomaterials by off-axis electron holography

Luying Li ¹Yongfa Cheng ¹Zunyu Liu ¹Shuwen Yan ¹Li Li ¹Jianbo Wang ²Lei Zhang ³Yihua Gao¹

作者信息

1. Center for Nanoscale Characterization&Devices,Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China
2. School of Physics and Technology,Center for Electron Microscopy,MOE Key Laboratory of Artificial Micro-and Nano-Structures,and the Institute for Advanced Studies,Wuhan University,Wuhan 430072,China
3. Ministry-of-Education Key Laboratory for the Green Preparation and Application of Functional Materials,Hubei Collaborative Innovation Center for Advanced Organic Chemical Materials,School of Materials Science and Engineering,Hubei University,Wuhan 430062,China
折叠

摘要

关键词

semiconductor nanostructure/structure-property relationship/off-axis electron holography/electrostatic potential/charge distribution

分类

信息技术与安全科学

引用本文复制引用

Luying Li,Yongfa Cheng,Zunyu Liu,Shuwen Yan,Li Li,Jianbo Wang,Lei Zhang,Yihua Gao..Study of structure-property relationship of semiconductor nanomaterials by off-axis electron holography[J].半导体学报:英文版,2022,43(4):P.36-45,10.

基金项目

supported by the National Natural Science Foundation of China (51871104) （51871104）

the Fundamental Research Funds for the Central Universities (No.2019kfy RCPY074)。（No.2019kfy RCPY074）

半导体学报:英文版

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ISSN：1674-4926

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