首页|期刊导航|半导体学报（英文版）|A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC

A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC

Wenjing Xu Jie Chen Zhangqu Kuang Li Zhou Ming Chen Chengbin Zhang

半导体学报（英文版）2022，Vol.43Issue(8)：57-63,7.

半导体学报（英文版）2022，Vol.43Issue(8)：57-63,7.DOI:10.1088/1674-4926/43/8/082401

A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC

Wenjing Xu ¹Jie Chen ²Zhangqu Kuang ¹Li Zhou ³Ming Chen ¹Chengbin Zhang¹

作者信息

1. Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
2. University of Chinese Academy of Sciences,Beijing 100049,China
3. Will Semiconductor Co.Ltd.,Shanghai 201210,China
折叠

摘要

关键词

CMOS image sensor/4T pinned photodiode/single-slope ADC/correlated double sample/counting method

Key words

CMOS image sensor/4T pinned photodiode/single-slope ADC/correlated double sample/counting method

引用本文复制引用

Wenjing Xu,Jie Chen,Zhangqu Kuang,Li Zhou,Ming Chen,Chengbin Zhang..A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC[J].半导体学报（英文版）,2022,43(8):57-63,7.

基金项目

This work was supported by the National Key R&D Pro-gram of China(2019YFB2204304). （2019YFB2204304）

半导体学报（英文版）

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ISSN：1674-4926

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