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首页|期刊导航|半导体学报(英文版)|A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics

A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics

Xiaojie Wang Dingqu Lin Shaoxiong Wu Yuning Zhang Deyi Fu Zhengyun Wu Feng Zhang Zhanwei Shen Guoliang Zhang Yuyang Miao Tiange Li Xiaogang Zhu Jiafa Cai Rongdun Hong Xiaping Chen

半导体学报(英文版)2022,Vol.43Issue(12):85-93,9.
半导体学报(英文版)2022,Vol.43Issue(12):85-93,9.DOI:10.1088/1674-4926/43/12/122802

A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics

A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics

Xiaojie Wang 1Dingqu Lin 1Shaoxiong Wu 1Yuning Zhang 1Deyi Fu 1Zhengyun Wu 1Feng Zhang 1Zhanwei Shen 2Guoliang Zhang 3Yuyang Miao 1Tiange Li 1Xiaogang Zhu 1Jiafa Cai 1Rongdun Hong 1Xiaping Chen1

作者信息

  • 1. College of Physical Science and Technology,Xiamen University,Xiamen 361005,China
  • 2. Jiujiang Research Institute of Xiamen University,Jiujiang 332000,China
  • 3. Key Laboratory of Semiconductor Material Sciences,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
  • 折叠

摘要

关键词

breakdown voltage/specific on-resistance/silicon carbide/switching energy loss/super-junction-shield(SS)/trench gate MOSFET/grounded(G)/ungrounded(NG)

Key words

breakdown voltage/specific on-resistance/silicon carbide/switching energy loss/super-junction-shield(SS)/trench gate MOSFET/grounded(G)/ungrounded(NG)

引用本文复制引用

Xiaojie Wang,Dingqu Lin,Shaoxiong Wu,Yuning Zhang,Deyi Fu,Zhengyun Wu,Feng Zhang,Zhanwei Shen,Guoliang Zhang,Yuyang Miao,Tiange Li,Xiaogang Zhu,Jiafa Cai,Rongdun Hong,Xiaping Chen..A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics[J].半导体学报(英文版),2022,43(12):85-93,9.

基金项目

This work was supported by the National Natural Sci-ence Foundation of China(Grant No.62104222),the Natural Science Foundation of Fujian Province of China for Distin-guished Young Scholars(Grant No.2020J06002),the Science and Technology Project of Fujian Province of China(Grant No.2020I0001),the Science and Technology Key Projects of Xiamen(Grant No.3502ZCQ20191001),Shenzhen Science and Technology Program(Grant No.JSGG20201102-155800003),Jiangxi Provincial Natural Science Foundation(Grant No.20212ACB212005). (Grant No.62104222)

半导体学报(英文版)

1674-4926

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