首页|期刊导航|光:科学与应用(英文版)|Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
Di Wu Chong-Xin Shan Jiansheng Jie Chenguang Guo Longhui Zeng Xiaoyan Ren Zhifeng Shi Long Wen Qin Chen Meng Zhang XinJian Li
光:科学与应用(英文版)2023,Vol.12Issue(1):77-88,12.
光:科学与应用(英文版)2023,Vol.12Issue(1):77-88,12.
Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
摘要
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Di Wu,Chong-Xin Shan,Jiansheng Jie,Chenguang Guo,Longhui Zeng,Xiaoyan Ren,Zhifeng Shi,Long Wen,Qin Chen,Meng Zhang,XinJian Li..Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection[J].光:科学与应用(英文版),2023,12(1):77-88,12.基金项目
This work was financially supported by the National Natural Science Foundation of China(Nos.U2004165,U22A20138,52225303,91833303,and 12174349),Natural Science Foundation of Henan Province,China(No.202300410376),and Henan provincial key science and technology research projects(No.212102210130).We also thank the support from Collaborative Innovation Center of Suzhou Nano Science&Technology. (Nos.U2004165,U22A20138,52225303,91833303,and 12174349)