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Direct high-resolution X-ray imaging exploiting pseudorandomness

KyeoReh Lee Jun Lim Su Yong Lee YongKeun Park

光：科学与应用（英文版）2023，Vol.12Issue(5)：776-788,13.

Direct high-resolution X-ray imaging exploiting pseudorandomness

KyeoReh Lee ¹Jun Lim ²Su Yong Lee ²YongKeun Park³

作者信息

1. Department of Physics,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea||KAIST Institute for Health Science and Technology,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea
2. Pohang Accelerator Laboratory,Pohang University of Science and Technology,Pohang,Kyungbuk 37637,Republic of Korea
3. Department of Physics,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea||KAIST Institute for Health Science and Technology,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea||Tomocube Inc,Daejeon 34051,Republic of Korea
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摘要

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KyeoReh Lee,Jun Lim,Su Yong Lee,YongKeun Park..Direct high-resolution X-ray imaging exploiting pseudorandomness[J].光：科学与应用（英文版）,2023,12(5):776-788,13.

基金项目

This work was supported by the Tomocube,KAIST Advanced Institute for Science-X,National Research Foundation of Korea(2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314),an Institute of Information&Communications Technology Planning&Evaluation(IITP)grant funded by the Korean government(MSIT)(2021-0-00745),and Technology Innovation program(20011661)funded by the Ministry of Trade,Industry&Energy(MOTIE)Experiments at PLS-Ⅱ were supported in part by MSIT and POSTECH.The design diffuser and test object were fabricated by Pambos Charalambous of ZonePlates,Ltd.Field and aperture stops were fabricated at KARA(KAIST Analysis Center for Research Advancement). （2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314）

光：科学与应用（英文版）

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ISSN：2095-5545

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