哈尔滨工业大学学报（英文版）2023，Vol.30Issue(4)：68-75,8.DOI:10.11916/j.issn.1055-9113.2022023
Mathematical Insight into Moderate Inversion Gate Delay Variability for Ultradeep Submicron Digital Circuit Design
Mathematical Insight into Moderate Inversion Gate Delay Variability for Ultradeep Submicron Digital Circuit Design
Shruti Kalra1
作者信息
- 1. Department of Electronics and Communication Engineering,Jaypee Institute of Information Technology,Noida 201307,India
- 折叠
摘要
关键词
moderate inversion/ultradeep submicron/predictive technology model/variability/log skew normal distributionKey words
moderate inversion/ultradeep submicron/predictive technology model/variability/log skew normal distribution分类
信息技术与安全科学引用本文复制引用
Shruti Kalra..Mathematical Insight into Moderate Inversion Gate Delay Variability for Ultradeep Submicron Digital Circuit Design[J].哈尔滨工业大学学报（英文版）,2023,30(4):68-75,8.
