首页|期刊导航|农业科学学报(英文)|Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability
农业科学学报(英文)2023,Vol.22Issue(10):3006-3021,16.DOI:10.1016/j.jia.2023.02.039
Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability
Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability
摘要
关键词
controlled-release urea/lodging/grain yield/yield stability/wheatKey words
controlled-release urea/lodging/grain yield/yield stability/wheat引用本文复制引用
ZHANG Guang-xin,ZHAO De-hao,FAN Heng-zhi,LIU Shi-ju,LIAO Yun-cheng,HAN Juan..Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability[J].农业科学学报(英文),2023,22(10):3006-3021,16.基金项目
This research work was supported by the Key R&D Plan of Shaanxi Province Project,China(2023-YBNY-041),the Doctoral Graduates and Postdoctoral Researchers from Shanxi Province Come to Work to Reward Scientific Research Projects,China(SXBYKY2022119),and the Key Laboratory Project of Shanxi Province,China(202001-4). (2023-YBNY-041)