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The measurement of responsivity of infrared photodetectors using a cavity blackbody

Nong Li Yingqiang Xu Guiying Shen Hui Xie Jingming Liu Youwen Zhao Fenghua Wang Zhichuan Niu Dongwei Jiang Guowei Wang Weiqiang Chen Wenguang Zhou Junkai Jiang Faran Chang Hongyue Hao Donghai Wu

半导体学报(英文版)2023,Vol.44Issue(10):57-63,7.
半导体学报(英文版)2023,Vol.44Issue(10):57-63,7.DOI:10.1088/1674-4926/44/10/102301

The measurement of responsivity of infrared photodetectors using a cavity blackbody

The measurement of responsivity of infrared photodetectors using a cavity blackbody

Nong Li 1Yingqiang Xu 2Guiying Shen 3Hui Xie 3Jingming Liu 3Youwen Zhao 3Fenghua Wang 3Zhichuan Niu 2Dongwei Jiang 2Guowei Wang 2Weiqiang Chen 1Wenguang Zhou 1Junkai Jiang 1Faran Chang 4Hongyue Hao 2Donghai Wu2

作者信息

  • 1. State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China||College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 101408,China
  • 2. State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China||College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 101408,China||Center of Materials Science and Optoelectronics Engineering,College of Materials Science and Opto-Electronic Technology,University of Chi-nese Academy of Sciences,Beijing 100049,China
  • 3. Key Laboratory of Semiconductor Materials Science,Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices,Insti-tute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
  • 4. State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
  • 折叠

摘要

关键词

infrared photodetectors/responsivity calibration/cavity blackbody

Key words

infrared photodetectors/responsivity calibration/cavity blackbody

引用本文复制引用

Nong Li,Yingqiang Xu,Guiying Shen,Hui Xie,Jingming Liu,Youwen Zhao,Fenghua Wang,Zhichuan Niu,Dongwei Jiang,Guowei Wang,Weiqiang Chen,Wenguang Zhou,Junkai Jiang,Faran Chang,Hongyue Hao,Donghai Wu..The measurement of responsivity of infrared photodetectors using a cavity blackbody[J].半导体学报(英文版),2023,44(10):57-63,7.

基金项目

This work was supported by the National Key Tech-nologies R&D Program of China(No.2019YFA0705203,2019YFA070104),the National Natural Science Foundation of China(No.62004189),and the State Key Laboratory of Spe-cial Rare Metal Materials,Northwest Rare Metal Materials Research Institute(No.SKL2023K00X). (No.2019YFA0705203,2019YFA070104)

半导体学报(英文版)

OACSCDCSTPCDEI

1674-4926

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