高压物理学报2023，Vol.37Issue(6)：42-56,15.DOI:10.11858/gywlxb.20230694
基于原子力显微镜的压痕技术及其应用
Atomic Force Microscope Based Indentation Techniques and Their Applications
摘要
Abstract
Indentation techniques based on atomic force microscopy(AFM)have been widely used in characterizing the mechanical properties of various types of materials,due to their high lateral resolution and vertical precision.This review article begins with a concise introduction to the fundamental principles of AFM and related indentation techniques.Subsequently,it extensively discusses and reviews the applications of AFM-based indentation techniques in measuring the mechanical properties of low-dimensional materials,biological materials,etc.This article also reviews the latest progress of the applications of AFM in the research of high-pressure phase transition in two-dimensional materials.Particularly,we introduce a novel angstrom-indentation technique,which enables atomic-level deformation on the samples.Angstrom-indentation allows for highly effective characterization and tuning of the interlayer coupling in two-dimensional materials.Finally,we make an outlook on the development of AFM-based indentation techniques.关键词
原子力显微镜/压痕技术/二维材料/高压相变Key words
atomic force microscopy/indentation/two-dimensional materials/high-pressure phase transition分类
数理科学引用本文复制引用
王晓萌,高扬..基于原子力显微镜的压痕技术及其应用[J].高压物理学报,2023,37(6):42-56,15.基金项目
国家自然科学基金(12102386,12192211) （12102386,12192211）
