首页|期刊导航|半导体学报(英文版)|Multiple SiGe/Si layers epitaxy and SiGe selective etching for vertically stacked DRAM
Multiple SiGe/Si layers epitaxy and SiGe selective etching for vertically stacked DRAM
Zhenzhen Kong Yuhui Ren Chen Li Jiahan Yu Jinbiao Liu Jingxiong Liu Qinzhu Zhang Jianfeng Gao Huihui Li Xiangsheng Wang Junfeng Li Hongxiao Lin Henry H. Radamson Chao Zhao Tianchun Ye Guilei Wang Hailing Wang Yanpeng Song Junjie Li Xiaomeng Liu Anyan Du Yuanhao Miao Yiwen Zhang
半导体学报(英文版)2023,Vol.44Issue(12):145-153,9.
半导体学报(英文版)2023,Vol.44Issue(12):145-153,9.DOI:10.1088/1674-4926/44/12/124101
Multiple SiGe/Si layers epitaxy and SiGe selective etching for vertically stacked DRAM
Multiple SiGe/Si layers epitaxy and SiGe selective etching for vertically stacked DRAM
摘要
关键词
RPCVD/epitaxy/SiGe/Si multilayers/L-GAAFETs/VS-DRAMKey words
RPCVD/epitaxy/SiGe/Si multilayers/L-GAAFETs/VS-DRAM引用本文复制引用
Zhenzhen Kong,Yuhui Ren,Chen Li,Jiahan Yu,Jinbiao Liu,Jingxiong Liu,Qinzhu Zhang,Jianfeng Gao,Huihui Li,Xiangsheng Wang,Junfeng Li,Hongxiao Lin,Henry H. Radamson,Chao Zhao,Tianchun Ye,Guilei Wang,Hailing Wang,Yanpeng Song,Junjie Li,Xiaomeng Liu,Anyan Du,Yuanhao Miao,Yiwen Zhang..Multiple SiGe/Si layers epitaxy and SiGe selective etching for vertically stacked DRAM[J].半导体学报(英文版),2023,44(12):145-153,9.基金项目
This work is supported in part by the Strategic Priority Research Program of the Chinese Academy of Sciences(Project ID.XDA0330300),in part by Innovation Program for Quantum Science and Technology(Project ID.2021ZD0302301),and in part by the Youth Innovation Promo-tion Association of CAS(Project ID.2020037).And Beijing Superstring Academy of Memory Technology has given strong technical and testing support. (Project ID.XDA0330300)