基于ATE的高速DAC射频参数SFDR测试技术优化OACSTPCD

When using the integrated circuit automatic test equipment(ATE)to test the radio frequency(RF)parameters of high-speed digital to analog converter(DAC),due to reasons such as long PCB wiring,high losses,and greater signal jitter provided by the machine compared to the actual installation,the testing indicators of high-speed DAC RF parameters on ATE are lower than the actual installation test values.Therefore,the working principle and testing methods of DAC circuits are introduced.To address the above issues,a series of improvements were made to the generation of test codes and PCB layout,and the testing values before and after the improvements were compared with typical values.The results show that the improvement measures can realize significant results,greatly optimizing the testing indicators of high-speed DAC RF parameters,and making the dynamic parameter indicators of high-frequency DAC such as SFDR close to or reach the actual test values.