现代电子技术2024，Vol.47Issue(2)：16-20,5.DOI:10.16652/j.issn.1004-373x.2024.02.004
基于ATE的高速DAC射频参数SFDR测试技术优化
ATE-based optimization of testing technology for RF parameter SFDR of high-speed DAC
沈锺杰 1张一圣 1孔锐 1王建超1
作者信息
- 1. 中国电子科技集团公司 第五十八研究所, 江苏 无锡 214035
- 折叠
摘要
Abstract
When using the integrated circuit automatic test equipment(ATE)to test the radio frequency(RF)parameters of high-speed digital to analog converter(DAC),due to reasons such as long PCB wiring,high losses,and greater signal jitter provided by the machine compared to the actual installation,the testing indicators of high-speed DAC RF parameters on ATE are lower than the actual installation test values.Therefore,the working principle and testing methods of DAC circuits are introduced.To address the above issues,a series of improvements were made to the generation of test codes and PCB layout,and the testing values before and after the improvements were compared with typical values.The results show that the improvement measures can realize significant results,greatly optimizing the testing indicators of high-speed DAC RF parameters,and making the dynamic parameter indicators of high-frequency DAC such as SFDR close to or reach the actual test values.关键词
集成电路/自动测试设备(ATE)/高速数模转换器/射频参数/SFDR参数/测试码/PCB测试板Key words
integrated circuit/ATE/high-speed DAC/RF parameter/spurious free dynamic range(SFDR)parameter/testing code/PCB testing board分类
电子信息工程引用本文复制引用
沈锺杰,张一圣,孔锐,王建超..基于ATE的高速DAC射频参数SFDR测试技术优化[J].现代电子技术,2024,47(2):16-20,5.
