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位移损伤效应对AlGaN/GaN HEMT器件的影响

陈柏炜 钟向丽 孙常皓 马腾 宋宏甲 王金斌 彭超 张战刚 雷志锋 梁朝辉

原子能科学技术2023,Vol.57Issue(12):2274-2280,7.
原子能科学技术2023,Vol.57Issue(12):2274-2280,7.DOI:10.7538/yzk.2023.youxian.0555

位移损伤效应对AlGaN/GaN HEMT器件的影响

Influence of Displacement Damage Effect on AlGaN/GaN HEMT Devices

陈柏炜 1钟向丽 2孙常皓 1马腾 3宋宏甲 2王金斌 2彭超 3张战刚 3雷志锋 3梁朝辉3

作者信息

  • 1. 湘潭大学材料科学与工程学院,湖南湘潭 411105||工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室,广东广州 511370
  • 2. 湘潭大学材料科学与工程学院,湖南湘潭 411105
  • 3. 工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室,广东广州 511370
  • 折叠

摘要

Abstract

AlGaN/GaN high electron mobility transistors(HEMTs)have excellent physical and chemical stability,which gives it great potential for use in consumer,industrial and space applications.However,the defects of cpitaxial growth AlGaN/GaN HEMTs are difficult to completely remove,and high-density defects strongly affect the radiation resistance of the devices.Therefore,understanding the evolution and mecha-nism of defects under particle irradiation is of great significance for improving the radiation resistance.The degradation mechanisms in AlGaN/GaN HEMTs irradiated by 3 MeV protons and 14 MeV neutrons were investigated.After 3 MeV proton irradia-tions with a flux of 4×1014 cm-2 and 1×1015 cm-2 and 14 MeV neutron irradiations with a flux of 1.2×1012 cm-2 and 2×1013 cm-2,the AlGaN/GaN HEMTs shows decrease in saturation drain current and peak transconductance,positive drift in threshold voltage.The defects of AlGaN/GaN HEMTs induced by irradiation were tested and studied by deep level transient spectroscopy(DLTS).The decreasing of defect concentration induced by 3 MeV proton irradiation reduces the reverse gate leakage current,while 14 MeV neutron irradiation causes defect concentration increases,increasing the reverse gate leakage current.According to the defect energy levels after proton and neutron irradiation are both(0.850±0.020)eV,it is inferred that the defect types are nitrogen interstitial defects.The displacement damage effect caused by the displacement of nitrogen interstitial defects after neutron and proton irradiation is the main reason for the electrical performance degradation of AlGaN/GaN HEMT devices.

关键词

AlGaN/GaN HEMT/质子辐照/中子辐照/位移损伤

Key words

AlGaN/GaN HEMT/proton irradiation/neutron irradiation/displacement damage

分类

能源科技

引用本文复制引用

陈柏炜,钟向丽,孙常皓,马腾,宋宏甲,王金斌,彭超,张战刚,雷志锋,梁朝辉..位移损伤效应对AlGaN/GaN HEMT器件的影响[J].原子能科学技术,2023,57(12):2274-2280,7.

基金项目

国家自然科学基金(12075065,12275230,12027813) (12075065,12275230,12027813)

空间环境材料行为及评价技术国家级重点实验室基金(6142910220209) (6142910220209)

原子能科学技术

OA北大核心CSCDCSTPCD

1000-6931

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