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Design of Novel and Low Cost Triple-node Upset Self-recoverable Latch

BAI Na MING Tianbo XU Yaohua WANG Yi LI Yunfei LI Li

原子能科学技术2023，Vol.57Issue(12)：2326-2336,11.

原子能科学技术2023，Vol.57Issue(12)：2326-2336,11.DOI:10.7538/yzk.2023.youxian.0625

Design of Novel and Low Cost Triple-node Upset Self-recoverable Latch

BAI Na ¹MING Tianbo ²XU Yaohua ²WANG Yi ³LI Yunfei ³LI Li⁴

作者信息

1. Information Materials and Intelligent Sensing Laboratory of Anhui Province,Anhui University,Hefei 230601,China||Shanxi Key Laboratory of Advanced Semiconductor Optoelectronic Devices and Integrated Systems,Jincheng 048000,China
2. Information Materials and Intelligent Sensing Laboratory of Anhui Province,Anhui University,Hefei 230601,China
3. Information Materials and Intelligent Sensing Laboratory of Anhui Province,Anhui University,Hefei 230601,China||Jincheng Research Institute of Opo-mechatronics Industry,Jincheng 048000,China
4. Shanxi Key Laboratory of Advanced Semiconductor Optoelectronic Devices and Integrated Systems,Jincheng 048000,China||Jincheng Research Institute of Opo-mechatronics Industry,Jincheng 048000,China
折叠

摘要

关键词

circuit reliability/latch design/self-recoverability/soft error/radiation hardening/triple-node upset

Key words

circuit reliability/latch design/self-recoverability/soft error/radiation hardening/triple-node upset

分类

能源科技

引用本文复制引用

BAI Na,MING Tianbo,XU Yaohua,WANG Yi,LI Yunfei,LI Li..Design of Novel and Low Cost Triple-node Upset Self-recoverable Latch[J].原子能科学技术,2023,57(12):2326-2336,11.

基金项目

The Open Project Program of the Shanxi Key Laboratory of Advanced Semiconductor Optoelectronic Devices and Inte-grated Systems(2023SZKF17) （2023SZKF17）

the University Synergy Innovation Program of Anhui Province(GXXT-2022-080) （GXXT-2022-080）

原子能科学技术

OA北大核心CSCDCSTPCD

ISSN：1000-6931

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