首页|期刊导航|中国电机工程学会电力与能源系统学报(英文版)|Influence of Parasitic Parameters on Dynamic Threshold Voltage Hysteresis of Silicon Carbide MOSFETs
中国电机工程学会电力与能源系统学报(英文版)2023,Vol.9Issue(6):2251-2262,12.DOI:10.17775/CSEEJPES.2022.00480
Influence of Parasitic Parameters on Dynamic Threshold Voltage Hysteresis of Silicon Carbide MOSFETs
Influence of Parasitic Parameters on Dynamic Threshold Voltage Hysteresis of Silicon Carbide MOSFETs
摘要
关键词
Dynamic hysteresis curve/parasitic parameters/silicon carbide(SiC)MOSFETs/switching characteristics/threshold voltage hysteresisKey words
Dynamic hysteresis curve/parasitic parameters/silicon carbide(SiC)MOSFETs/switching characteristics/threshold voltage hysteresis引用本文复制引用
Yumeng Cai,Tong Sun,Peng Sun,Zhibin Zhao,Xuebao Li,Hui Wang,Zhong Chen,Boyuan Cao..Influence of Parasitic Parameters on Dynamic Threshold Voltage Hysteresis of Silicon Carbide MOSFETs[J].中国电机工程学会电力与能源系统学报(英文版),2023,9(6):2251-2262,12.基金项目
This work was supported by the Science and Technology Project of State Grid Corporation of China(No.52094021N012). (No.52094021N012)