电测与仪表2024，Vol.61Issue(1)：201-206,6.DOI:10.19753/j.issn1001-1390.2024.01.031
级联MOSFET均压测试方法研究
Study on cascaded MOSFETs voltage-sharing test method
摘要
Abstract
In this paper,the influence of isolated high-voltage probe parasitic parameters on the cascaded MOSFETs volt-age-sharing in traditional voltage-sharing test method is investigated.By changing the number of VDS measuring probes in the same high-side MOSFET,the interference degree of the parasitic parameters introduced into the test method to the transient voltage-sharing is analyzed.On this basis,a test method of voltage-sharing by subtraction is proposed,and its optimization is analyzed and verified by experiments.The experimental results show that the proposed method can accu-rately evaluate the voltage-sharing effect of cascaded MOSFETs in steady state and ON/OFF transients,and it is not affect-ed by the parasitic parameters of the test cable.关键词
级联MOSFET/均压测试/高压开关/寄生参数Key words
cascaded MOSFETs/voltage-sharing test/high-voltage switch/parasitic parameter分类
信息技术与安全科学引用本文复制引用
付明,王子才,张华,张东来..级联MOSFET均压测试方法研究[J].电测与仪表,2024,61(1):201-206,6.基金项目
国家自然科学基金资助项目(51777041) （51777041）
深圳市科技计划项目(JSGG20190823144607320) （JSGG20190823144607320）
国家科技重大专项项目(2017ZX01013101-003) （2017ZX01013101-003）
