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Deep Learning-Assisted OFDM Detection with Hardware Impairments

Amit Singh Sanjeev Sharma Kuntal Deka Vimal Bhatia

Journal of Communications and Information Networks2023，Vol.8Issue(4)：P.378-388,11.

Deep Learning-Assisted OFDM Detection with Hardware Impairments

Amit Singh ¹Sanjeev Sharma ¹Kuntal Deka ²Vimal Bhatia³

作者信息

1. Indian Institute of Technology(IIT)BHU Varanasi,Varanasi 221005,India
2. Indian Institute of Technology(IIT)Guwahati,Guwahati 781039,India
3. Indian Institute of Technology(IIT)Indore,Indore 452020,India
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摘要

关键词

OFDM/DL/HIs/channel estimation/signal detection

分类

信息技术与安全科学

引用本文复制引用

Amit Singh,Sanjeev Sharma,Kuntal Deka,Vimal Bhatia..Deep Learning-Assisted OFDM Detection with Hardware Impairments[J].Journal of Communications and Information Networks,2023,8(4):P.378-388,11.

基金项目

supported by the Ministry of Science and Technology,SERB under Grant SRG/2021/000199 and by the Indian National Academy of Engineering(INAE)Project with Sanction under Grant 2023/INTW/10. （INAE）

Journal of Communications and Information Networks

OACSCDEI

ISSN：2096-1081

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